hwLoopLineTestSysConfigPara
HUAWEI-COMMTEST-MIB ·
.1.3.6.1.4.1.2011.6.21.1.1.1.9
Object
node
No description available.
Context
- MIB
- HUAWEI-COMMTEST-MIB
- OID
.1.3.6.1.4.1.2011.6.21.1.1.1.9- Type
- node
- Parent
- hwTestCommonMIBObjects
- Siblings
- 13
- Children
- 5
Syntax
No syntax metadata recorded.
Values & Constraints
No enumerated values or constraints recorded.
Related Objects
Sibling Objects
| Object | Type | Syntax | OID |
|---|---|---|---|
| hwTestGroupOprTable Table of the test group:
It provides the number of the test group to which a shelf of the device corresponds.
It is uniquely identified by the number of the test group. Multiple s… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.1 |
| hwONTPotsTestOprTable This table is used for enabling the POTS port line test of the ONT by setting the test
item, test frequency, and test threshold. This test helps operators locate faults and
provis… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.10 |
| hwPortTestingListOprTable This table is used to query the ports under a test by board.
The indexes of this table are hwFrameIndex and hwSlotIndex. | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.11 |
| hwWettingCurrentOprTable This table is used for enabling the wetting current by setting the wetting current's
working voltage, maximum voltage and slope.
The index of this table is ifindex. | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.12 |
| hwLoopLineTestMeltChipStateTable This table is used for manually starting a MELT chip status check on an xDSL board, and obtaining the status of the MELT chip.
The indexes of this table are hwFrameIndex and hwSlo… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.13 |
| hwMeltChipStateCheck | node | - | .1.3.6.1.4.1.2011.6.21.1.1.1.14 |
| hwLoopLineTestOprTable This table is used for enabling a subscriber line test and obtaining the test result
after a test is complete. The subscriber line test function can be used for obtaining
the per… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.2 |
| hwMeterTestOprTable Operation table of the meter test.
It implements the meter test function in the system. The test board provides the interface connected to the external test meter such as a multim… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.3 |
| hwTestBoardDiagnoseTestOprTable Operation table of the self-test on the test board.
It implements the self-test on the test board in the system. The self-test checks whether the test board can work in the normal… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.4 |
| hwTestBoardStatusQueryOprTable Operation table for querying the status of the test board.
It implements the function of querying the status of the test board in the system. You can query the current status of t… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.5 |
| hwSearchingToneOprTable This table is used for enabling the searching tone test by setting the searching tone
test voltage level, test frequency, and test duration. The searching tone test
is to locate a… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.6 |
| hwLoopLineTestCalibrationTable This table provides the test calibration data of a line. Before delivery,
each port is performed with a test in which no user is connected to the
port and the test result is saved… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.7 |
| hwLoopLineTestMeltVerTable This table provides the information about the MELT chip on the board,
including the vendor, hardware version, and software version.
The indexes of this table are hwFrameIndex and … | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.8 |
Child Objects
| Object | Type | Syntax | OID |
|---|---|---|---|
| hwLoopLineTestSysConfigConvertAB Indicates the polarity of A wire and B wire.
Options:
1. normal(1) -default polarity of A wire and B wire
2. reverse(2) -reverse polarity of A wire and B wire
3. invalid(-1) -… | scalar | Enumeration | .1.3.6.1.4.1.2011.6.21.1.1.1.9.1 |
| hwLoopLineTestSysConfigCableFactor The cable-factor used to detect significant terminal device capacitance.
The cable-factor ranges from 1 to 1000 units of 0.001
(Physical values are 0.001 to 1, default: 0.083). | scalar | Unsigned32 | .1.3.6.1.4.1.2011.6.21.1.1.1.9.2 |
| hwLoopLineTestSysConfigSigCapUpperLimit The three parameters(capacitance's upper-limit value, lower-limit value and resistance value) are used to determine the signature's existence.
The capacitance ranges from 50nF to … | scalar | Unsigned32 | .1.3.6.1.4.1.2011.6.21.1.1.1.9.3 |
| hwLoopLineTestSysConfigSigCapLowerLimit The three parameters(capacitance's upper-limit value, lower-limit value and resistance value) are used to determine the signature's existence.
The capacitance ranges from 50nF to … | scalar | Unsigned32 | .1.3.6.1.4.1.2011.6.21.1.1.1.9.4 |
| hwLoopLineTestSysConfigSigResistance The three parameters(capacitance's upper-limit value, lower-limit value and resistance value) are used to determine the signature's existence.
The resistance ranges from 10000ohm … | scalar | Unsigned32 | .1.3.6.1.4.1.2011.6.21.1.1.1.9.5 |