hwTestGroupOprTable
HUAWEI-COMMTEST-MIB ·
.1.3.6.1.4.1.2011.6.21.1.1.1.1
Object
table
Table of the test group: It provides the number of the test group to which a shelf of the device corresponds. It is uniquely identified by the number of the test group. Multiple shelves can share a test board. A test group corresponds to a test board. The number of a test group is the same as the number of the shelf that houses the test board to which the test group corresponds. The index of this table is hwTestGroupNo.
Context
- MIB
- HUAWEI-COMMTEST-MIB
- OID
.1.3.6.1.4.1.2011.6.21.1.1.1.1- Type
- table
- Status
- current
- Parent
- hwTestCommonMIBObjects
- Siblings
- 13
- Children
- 1
Syntax
No syntax metadata recorded.
Values & Constraints
No enumerated values or constraints recorded.
Related Objects
Sibling Objects
| Object | Type | Syntax | OID |
|---|---|---|---|
| hwONTPotsTestOprTable This table is used for enabling the POTS port line test of the ONT by setting the test
item, test frequency, and test threshold. This test helps operators locate faults and
provis… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.10 |
| hwPortTestingListOprTable This table is used to query the ports under a test by board.
The indexes of this table are hwFrameIndex and hwSlotIndex. | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.11 |
| hwWettingCurrentOprTable This table is used for enabling the wetting current by setting the wetting current's
working voltage, maximum voltage and slope.
The index of this table is ifindex. | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.12 |
| hwLoopLineTestMeltChipStateTable This table is used for manually starting a MELT chip status check on an xDSL board, and obtaining the status of the MELT chip.
The indexes of this table are hwFrameIndex and hwSlo… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.13 |
| hwMeltChipStateCheck | node | - | .1.3.6.1.4.1.2011.6.21.1.1.1.14 |
| hwLoopLineTestOprTable This table is used for enabling a subscriber line test and obtaining the test result
after a test is complete. The subscriber line test function can be used for obtaining
the per… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.2 |
| hwMeterTestOprTable Operation table of the meter test.
It implements the meter test function in the system. The test board provides the interface connected to the external test meter such as a multim… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.3 |
| hwTestBoardDiagnoseTestOprTable Operation table of the self-test on the test board.
It implements the self-test on the test board in the system. The self-test checks whether the test board can work in the normal… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.4 |
| hwTestBoardStatusQueryOprTable Operation table for querying the status of the test board.
It implements the function of querying the status of the test board in the system. You can query the current status of t… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.5 |
| hwSearchingToneOprTable This table is used for enabling the searching tone test by setting the searching tone
test voltage level, test frequency, and test duration. The searching tone test
is to locate a… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.6 |
| hwLoopLineTestCalibrationTable This table provides the test calibration data of a line. Before delivery,
each port is performed with a test in which no user is connected to the
port and the test result is saved… | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.7 |
| hwLoopLineTestMeltVerTable This table provides the information about the MELT chip on the board,
including the vendor, hardware version, and software version.
The indexes of this table are hwFrameIndex and … | table | - | .1.3.6.1.4.1.2011.6.21.1.1.1.8 |
| hwLoopLineTestSysConfigPara | node | - | .1.3.6.1.4.1.2011.6.21.1.1.1.9 |
Child Objects
| Object | Type | Syntax | OID |
|---|---|---|---|
| hwTestGroupOprEntry Table of the test group:
It provides the number of the test group to which a shelf of the device corresponds.
It is uniquely identified by the number of the test group. Multiple s… | row | - | .1.3.6.1.4.1.2011.6.21.1.1.1.1.1 |