hwXponDeviceOtdrTestFreq

HUAWEI-XPON-COMMON-MIB · .1.3.6.1.4.1.2011.6.145.1.1.1.21.1.8

Object

column r/w Enumeration
Sampling frequency of the OTDR test; Fclk indicates the clock frequency.
Options: 
1.doubleFclk(1)                   - Indicates that the sampling frequency of OTDR test is 2 x Fclk.
2.fclk(2)                         - Indicates that the sampling frequency of OTDR test is Fclk.
3.halfFclk(3)                     - Indicates that the sampling frequency of OTDR test is 1/2 x Fclk.
4.quarterFclk(4)                  - Indicates that the sampling frequency of OTDR test is 1/4 x Fclk.
5.eighthFclk(5)                   - Indicates that the sampling frequency of OTDR test is 1/8 x Fclk.
6.invalid(-1)                     - Indicates that the query fails or no information is detected.
Default:quarterFclk(4).

Context

MIB
HUAWEI-XPON-COMMON-MIB
OID
.1.3.6.1.4.1.2011.6.145.1.1.1.21.1.8
Type
column
Access
readwrite
Status
current
Parent
hwXponDeviceOtdrTestEntry
Table
hwXponDeviceOtdrTestTable
Siblings
20

Syntax

Enumeration

Values & Constraints

Enumerated Values
-1invalid
1doubleFclk
2fclk
3halfFclk
4quarterFclk
5eighthFclk

Related Objects

Sibling Objects