hwPotsSelfCircuitTestTrap

HUAWEI-NTEST-MIB · .1.3.6.1.4.1.2011.6.21.2.2.3.0.71

Object

notification
Trap for the result of the PSTN circuit test:
1: hwPotsSelfCircuitTestLoopRequestID; 
2: hwPotsSelfCircuitTestStatus; 
3: hwPotsSelfCircuitTestVDDResult; 
4: hwPotsSelfCircuitTestVBATLResult; 
5: hwPotsSelfCircuitTestVBATHResult; 
6: hwPotsSelfCircuitTestVBATRResult; 
7: hwPotsSelfCircuitTestLoopCurrentResult; 
8: hwPotsSelfCircuitTestFeedVResult; 
9: hwPotsSelfCircuitTestRingVResult; 
10: hwPotsSelfCircuitTestRingFResult;
11: hwPotsSelfCircuitTestVAGResult;
12: hwPotsSelfCircuitTestVBGResult;
13: hwPotsSelfCircuitTestFeedVValue;
14: hwPotsSelfCircuitTestRingVValue;
15: hwPotsSelfCircuitTestLoopCurrentValue;
16: hwPotsSelfCircuitTestLoopIfIndex;
17:hwPotsSelfCircuitTestOnHookDetectResult  ;
18:hwPotsSelfCircuitTestOffHookDetectResult ;
19:hwPotsSelfCircuitTestStopRingResult      ;
20:hwPotsSelfCircuitTestVPoleResult         ;
21:hwPotsSelfCircuitTestVBATLValue          ;
22:hwPotsSelfCircuitTestVBATHValue          ;
23:hwPotsSelfCircuitTestVBATRValue          ;
24:hwPotsSelfCircuitTestRingFValue          ;
25:hwPotsSelfCircuitTestVAGValue            ;
26:hwPotsSelfCircuitTestVBGValue            ;
27:hwPotsSelfCircuitTestVABPoleValue        ;
28:hwPotsSelfCircuitTestABLCurrentValue     ;
29:hwPotsSelfCircuitTestSLICTempValue       ;

Context

MIB
HUAWEI-NTEST-MIB
OID
.1.3.6.1.4.1.2011.6.21.2.2.3.0.71
Type
notification
Status
current
Parent
hwNTestGeneralTrapsOIDs
Siblings
24

Syntax

No syntax metadata recorded.

Values & Constraints

No enumerated values or constraints recorded.

Related Objects

Sibling Objects
Notification Objects