hwPotsSelfCircuitTestBusyProcFlag

HUAWEI-NTEST-MIB · .1.3.6.1.4.1.2011.6.21.2.1.1.27.1.2

Object

column r/w Enumeration
Circuit test-Busy control.
Options: 
 1. busynotest(1)    -indicates no test when busy 
 2. busytest(2)      -indicates remedy test when busy 
 3. busystrentest(3) -indicates force to test when busy 
 4. deferredtest(4)  -indicates defer test when busy:
  If the port is busy, the test operation will be deferred. If the port changes to idle state before 
time out, circuit test will be executed immediately. If the port keeps busy by the time out, 
the system will excecute a corresponding operation according to what the user specified: canceling 
the test or forcing to test.
  If the value of this leaf node is deferredtest(4), both hwPotsSelfCircuitTestDeferredTime and 
hwPotsSelfCircuitTestTimeoutProc must be set.

Context

MIB
HUAWEI-NTEST-MIB
OID
.1.3.6.1.4.1.2011.6.21.2.1.1.27.1.2
Type
column
Access
readwrite
Status
current
Parent
hwPotsSelfCircuitTestOprEntry
Table
hwPotsSelfCircuitTestOprTable
Siblings
32

Syntax

Enumeration

Values & Constraints

Enumerated Values
1busynotest
2busytest
3busystrentest
4deferredtest

Related Objects

Sibling Objects