hwTestMeltChipFaultAlarmTrap

HUAWEI-COMMTEST-MIB · .1.3.6.1.4.1.2011.6.21.1.2.2.0.4

Object

notification
MELT chip fault trap:
1: hwFrameIndex; 2: hwSlotIndex; 3: hwTestMeltChipID; 4: hwPortMeltChipStateList.
When detecting a MELT chip fault, the system generates this trap.

Context

MIB
HUAWEI-COMMTEST-MIB
OID
.1.3.6.1.4.1.2011.6.21.1.2.2.0.4
Type
notification
Status
current
Parent
hwTestCommonAlarmTrapsOIDs
Siblings
4

Syntax

No syntax metadata recorded.

Values & Constraints

No enumerated values or constraints recorded.

Related Objects

Sibling Objects
Notification Objects