hwTestCommonAlarmTrapsOIDs
HUAWEI-COMMTEST-MIB ·
.1.3.6.1.4.1.2011.6.21.1.2.2.0
Object
node
No description available.
Context
- MIB
- HUAWEI-COMMTEST-MIB
- OID
.1.3.6.1.4.1.2011.6.21.1.2.2.0- Type
- node
- Parent
- hwTestCommonAlarmTraps
- Children
- 5
Syntax
No syntax metadata recorded.
Values & Constraints
No enumerated values or constraints recorded.
Related Objects
Child Objects
| Object | Type | Syntax | OID |
|---|---|---|---|
| hwTestRingSrcFailTrap The btss ring source failed trap:
1: hwTestBoardIfIndex; 2: hwTestRingSrcAlarmReason (1: the ring source of BTSS doesn't work)
Troubleshooting suggestions: (1) Check the BTSS boar… | notification | - | .1.3.6.1.4.1.2011.6.21.1.2.2.0.1 |
| hwTestRingSrcRestoreTrap Test ringing source restore trap:
1: hwTestBoardIfIndex; 2: hwTestRingSrcAlarmReason (1: the ring source of BTSS is normal)
The advice: none.
This trap will send when test ringing… | notification | - | .1.3.6.1.4.1.2011.6.21.1.2.2.0.2 |
| hwTestAutoClearedTrap Trap of test automatically cancelled:
1: hwTestBoardIfIndex; 2: hwTestBoardStatusTestedBoardIfIndex; 3: hwTestClearedReason.
This trap will send when the test automatically cancel… | notification | - | .1.3.6.1.4.1.2011.6.21.1.2.2.0.3 |
| hwTestMeltChipFaultAlarmTrap MELT chip fault trap:
1: hwFrameIndex; 2: hwSlotIndex; 3: hwTestMeltChipID; 4: hwPortMeltChipStateList.
When detecting a MELT chip fault, the system generates this trap. | notification | - | .1.3.6.1.4.1.2011.6.21.1.2.2.0.4 |
| hwTestMeltChipRecoveryAlarmTrap MELT chip fault clear trap:
1: hwFrameIndex; 2: hwSlotIndex; 3: hwTestMeltChipID; 4: hwPortMeltChipStateList.
When detecting that a MELT chip fault is cleared, the system generate… | notification | - | .1.3.6.1.4.1.2011.6.21.1.2.2.0.5 |