hwPstnCircuitTestOffHookResult

HUAWEI-NTEST-MIB · .1.3.6.1.4.1.2011.6.21.2.1.1.1.1.18

Object

column Enumeration

Describes the Circuit Test Result-Off hook.
Options:
   1. normal(1)        -indicates Normal          
   2. abnormal(2)      -indicates Abnormal        
   3. testouttime(3)   -indicates time out          
   4. nosupport(4)     -not support the test

Context

MIB: HUAWEI-NTEST-MIB
OID: .1.3.6.1.4.1.2011.6.21.2.1.1.1.1.18
Type: column
Access: readonly
Status: current
Parent: hwPstnCircuitTestOprEntry

Syntax

Enumeration

Values & Constraints

Enumerated Values

`1`	normal
`2`	abnormal
`3`	testouttime
`4`	nosupport