hwPotsSelfCircuitTestBusyProcFlag

Circuit test-Busy control.
Options: 
 1. busynotest(1)    -indicates no test when busy 
 2. busytest(2)      -indicates remedy test when busy 
 3. busystrentest(3) -indicates force to test when busy 
 4. deferredtest(4)  -indicates defer test when busy:
  If the port is busy, the test operation will be deferred. If the port changes to idle state before 
time out, circuit test will be executed immediately. If the port keeps busy by the time out, 
the system will excecute a corresponding operation according to what the user specified: canceling 
the test or forcing to test.
  If the value of this leaf node is deferredtest(4), both hwPotsSelfCircuitTestDeferredTime and 
hwPotsSelfCircuitTestTimeoutProc must be set.

MIB

HUAWEI-NTEST-MIB

OID

.1.3.6.1.4.1.2011.6.21.2.1.1.27.1.2

Type

column

Access

readwrite

Status

current

Parent

hwPotsSelfCircuitTestOprEntry