hwSDLDMMTestOprEntry

HUAWEI-NTEST-MIB · .1.3.6.1.4.1.2011.6.21.2.1.1.25.1

Object

row
Operation table for the SDL DMM test: 
It realizes the function of the SDL DMM test in the system. 
In the test, the voltage, resistance, and capacitance of the 
loop line are tested to check for faults such as broken circuit,
short circuit, grounding and cross-connected line.
The index of this entry is ifIndex

Context

MIB
HUAWEI-NTEST-MIB
OID
.1.3.6.1.4.1.2011.6.21.2.1.1.25.1
Type
row
Status
current
Parent
hwSDLDMMTestOprTable
Table
hwSDLDMMTestOprTable
Children
18

Syntax

No syntax metadata recorded.

Values & Constraints

No enumerated values or constraints recorded.

Related Objects

Child Objects
Indexes