ctWanHDSLTestMode

CTRON-WAN-MIB · .1.3.6.1.4.1.52.4.1.2.7.1.8.4.1.2
MIB view Table view

Object

column mandatory r/w Integer32 
This object may only be successfully set on a master device.
When this object is set, the local unit's test mode is
defined by these values when set:
              
   1 - Normal operation
   3 - Self test mode
   4 - PROM check test
   5 - External RAM test
   6 - DS1 loop test
   7 - MUX-DMUX test
   9 - Analog loopback mode
  13 - Transceiver mode
              
When getting this object, the value returned represents
the last value this object had been set to.

Context

MIB
CTRON-WAN-MIB
OID
.1.3.6.1.4.1.52.4.1.2.7.1.8.4.1.2
Type
column
Access
readwrite
Status
mandatory
Parent
ctWanHDSLTestEntry
Table
ctWanHDSLTestTable
Siblings
3

Syntax

Integer32
Source
COPS-PR-SPPIInteger32
Base type
Integer32

Values & Constraints

Type Constraints
range: -2147483648..2147483647

Related Objects

Sibling Objects
ObjectTypeSyntaxOID
ctWanHDSLTestHLUConnIndex mandatory
Identify the slot of the HDSL within the device that the user wants to conduct the line unit test. Slot number start from 1 to maximum slots available in the device.
columnInteger32.1.3.6.1.4.1.52.4.1.2.7.1.8.4.1.1
ctWanHDSLHLUTestResult mandatory
Test result for the local line unit (1 - test failed, 0 - success): bit 0 - 2180 DS1 frame sync test (HiGain only) 1 - 2180 DS1 data test (HiGain only) 2 - LIU DS1 frame s…
columnInteger32.1.3.6.1.4.1.52.4.1.2.7.1.8.4.1.3
ctWanHDSLHRUTestResult mandatory
Test results for the remote line unit, Bit definitions correspond to those defined for ctWanHDSLHLUTestResult.
columnInteger32.1.3.6.1.4.1.52.4.1.2.7.1.8.4.1.4