hwXponDeviceOtdrTestFreq

Sampling frequency of the OTDR test; Fclk indicates the clock frequency.
Options: 
1.doubleFclk(1)                   - Indicates that the sampling frequency of OTDR test is 2 x Fclk.
2.fclk(2)                         - Indicates that the sampling frequency of OTDR test is Fclk.
3.halfFclk(3)                     - Indicates that the sampling frequency of OTDR test is 1/2 x Fclk.
4.quarterFclk(4)                  - Indicates that the sampling frequency of OTDR test is 1/4 x Fclk.
5.eighthFclk(5)                   - Indicates that the sampling frequency of OTDR test is 1/8 x Fclk.
6.invalid(-1)                     - Indicates that the query fails or no information is detected.
Default:quarterFclk(4).

MIB

HUAWEI-XPON-COMMON-MIB

OID

.1.3.6.1.4.1.2011.6.145.1.1.1.21.1.8

Type

column

Access

readwrite

Status

current

Parent

hwXponDeviceOtdrTestEntry